Uncertainty and capability of quantitative EPMA at low voltage – A review-Reference-Cited by-同舟云学术

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Uncertainty and capability of quantitative EPMA at low voltage – A review

Published:2012-03-07 Issue: Volume:32 Page:012016
ISSN:1757-899X
Container-title:IOP Conference Series: Materials Science and Engineering
language:
Short-container-title:IOP Conf. Ser.: Mater. Sci. Eng.

Author:

Merlet C,Llovet X

Publisher

IOP Publishing

Subject

General Medicine

Link

http://stacks.iop.org/1757-899X/32/i=1/a=012016/pdf

Reference24 articles.

1. Barriers to quantitative electron probe x-ray microanalysis for low voltage scanning electron microscopy

2. Secondary electron emission and charging mechanisms in Auger Electron Spectroscopy and related e-beam techniques

3. Electron Probe Microanalysis of Thin Films and Multilayers Using the Computer Program XFILM

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