Depth profiling of LE-µSR parameters with musrfit

Abstract

Abstract The study of thin-film and multi-layered structures with nanometer resolution is possible with low energy µSR (LE-µSR). Modeling of the measured µSR parameters such as diamagnetic asymmetry and relaxation rate as a function of sample depth can be obtained from a series of experimental implantation energy measurements and its correlation with the simulated stopping profiles. The fitting approach assumes a sharp transition between regions with distinct properties. The fitting method, previously developed in matlab, was implemented in musrfit, a free µSR data analysis framework written in C++. The main goal is to make this fitting method widely available for energy dependent measurements and to increase the modeling possibilities within musrfit.