Structure and properties of Mn-Co-Ni-O thin films

Abstract

Abstract Mn1.56Co0.96Ni0.48O4 (MCN) thin films were prepared by chemical solution deposition method on the silicon substrate. The spinel structure and the dense surface morphology of the MCN thin films were characterized by X-ray diffraction, scanning electron microscopy and atomic force microscopy, respectively. The optical constants of the MCN thin films in the mid-infrared wavelength range were determined by measuring the ellipsometry parameters and modelling through the Drude-Lorentz oscillator dispersion formula. The refractive index decreases while the extinction coefficient increases with the increase of wavelength. The electrical resistance of the MCN thin films decreases rapidly with increasing temperature, indicating an NTC characteristic. It is expected that MCN thin films will show considerable application potential in the infrared detection.