Author:
Kim Y,Wolf C M,Sathe P S,Daugherty M C,Robinson S M,Kienzle P A,Bajcsy P,LaManna J M,Jacobson D L,Baltic E,Weigandt K M,Murphy R P,Klimov N N,Huber M G,Hussey D S
Abstract
Abstract
Dark-field imaging probes the projected autocorrelation function at the autocorrelation length of the grating interferometer and quantitatively accesses the parameters of a microstructure model. The National Institute of Standards and Technology has developed a novel far-field grating interferometer to study hierarchical materials in various fields such as polymer science, geology, additive manufacturing under the INFER project. In this work, we detail the simulation of dark-field imaging which is one of the goals of INFER.
Subject
Computer Science Applications,History,Education
Cited by
2 articles.
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