Author:
Long W.,Li X.,Liu Y.,Wu B.,Liu S.,Zhang C.,Chen S.,Zhu J.,Lu Z.,Li X.,Wu J.
Abstract
Abstract
A new generation of domestically generic control and data
acquisition AMC module has been developed to meet the requirements
of the upgrade and renovation of the RCS LLRF system in the CSNS-II
project, as well as the horizontal testing needs of the
SAPS-TP. This module complies with the MicroTCA.4 standard and
utilizes the Xilinx ZYNQ 7045 SOC as the core data processing
chip. It can simultaneously run FPGA algorithms and the EPICS IOC
remote control application program, serving as an autonomous control
node. The module is equipped with 8 channels of 125 MSPS 16-bit ADC
and 2 channels of 16-bit DAC with a maximum sampling rate of up to
500 MSPS. It also features standard expansion interface, front
optical panel fiber interface, external clock interface, front panel
digital IO interface, and more, catering to the needs of multiple
systems in accelerator facilities such as radio-frequency, beam
diagnostics, and control system. Additionally, the module can
function independently for smaller-scale experimental and testing
systems, such as the LLRF system for horizontal testing of
SAPS-TP. To guarantee the seamless integration and proper operation
of the AMC module within the MicroTCA.4 ecosystem, the MMC mezzanine
card has been developed and thoroughly tested. In order to further
reduce costs for small-scale systems, we optimized the software of
the MMC so that the AMC board can run without the MCH module and
realize self-health monitoring. For common applications, we have
developed a complete software architecture and demo programs,
including FPGA firmware, embedded Linux operating system, kernel
driver modules, and EPICS IOC demo application programs. Detailed
measurements have been conducted on hardware performance such as
SNR, SFDR, channel isolation, as well as software performance
including AXI DMA data bandwidth and system resources utilization,
etc. The measurement results indicate that the module's performance
indicators meet the design requirements.
Subject
Mathematical Physics,Instrumentation
Cited by
1 articles.
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