Studies of irradiated AMS H35 CMOS detectors for the ATLAS tracker upgrade
Author:
Publisher
IOP Publishing
Subject
Mathematical Physics,Instrumentation
Link
http://stacks.iop.org/1748-0221/12/i=01/a=C01074/pdf
Reference12 articles.
1. Overview of HVCMOS pixel sensors
2. Charge collection studies in irradiated HV-CMOS particle detectors
3. Radiation hardness studies of neutron irradiated CMOS sensors fabricated in the ams H18 high voltage process
Cited by 24 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Investigation of the Boron removal effect induced by 5.5 MeV electrons on highly doped EPI- and Cz-silicon;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2023-11
2. Bistable Boron-Related Defect Associated with the Acceptor Removal Process in Irradiated p-Type Silicon—Electronic Properties of Configurational Transformations;Sensors;2023-06-19
3. Microscopic origin of the acceptor removal in neutron-irradiated Si detectors - An atomistic simulation study;Acta Materialia;2022-12
4. Study of neutron irradiation effects in Depleted CMOS detector structures;Journal of Instrumentation;2022-03-01
5. The Boron–Oxygen (BᵢOᵢ) Defect Complex Induced by Irradiation With 23 GeV Protons in p-Type Epitaxial Silicon Diodes;IEEE Transactions on Nuclear Science;2022-03
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3