Predicting the effect of radiation damage on dark current in a space-qualified high performance CMOS image sensor-Reference-Cited by-同舟云学术

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Predicting the effect of radiation damage on dark current in a space-qualified high performance CMOS image sensor

Published:2019-11-07 Issue:11 Volume:14 Page:C11008-C11008
ISSN:1748-0221
Container-title:Journal of Instrumentation
language:
Short-container-title:J. Inst.

Author:

Crews C.,Soman M.R.,Lofthouse-Smith D-D.,Allanwood E.A.H.,Stefanov K.D.,Leese M.,Turner P.,Holland A.D.

Publisher

IOP Publishing

Subject

Mathematical Physics,Instrumentation

Link

https://iopscience.iop.org/article/10.1088/1748-0221/14/11/C11008/pdf

Reference9 articles.

1. Modeling the JANUS stray-light behavior

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4. Quantum Efficiency Simulation and Analysis of Irradiated Complementary Metal-Oxide Semiconductor Image Sensors;Journal of Nanoelectronics and Optoelectronics;2022-02-01

5. Photon detection probability enhancement using an anti-reflection coating in CMOS-based SPADs;Applied Optics;2021-08-30

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