First results on DEPFET Active Pixel Sensors fabricated in a CMOS foundry—a promising approach for new detector development and scientific instrumentation-Reference-Cited by-同舟云学术

First results on DEPFET Active Pixel Sensors fabricated in a CMOS foundry—a promising approach for new detector development and scientific instrumentation

Published:2017-11-16 Issue:11 Volume:12 Page:P11013-P11013
ISSN:1748-0221
Container-title:Journal of Instrumentation
language:
Short-container-title:J. Inst.

Author:

Aschauer S.,Majewski P.,Lutz G.,Soltau H.,Holl P.,Hartmann R.,Schlosser D.,Paschen U.,Weyers S.,Dreiner S.,Klusmann M.,Hauser J.,Kalok D.,Bechteler A.,Heinzinger K.,Porro M.,Titze B.,Strüder L.

Publisher

IOP Publishing

Subject

Mathematical Physics,Instrumentation

Link

http://stacks.iop.org/1748-0221/12/i=11/a=P11013/pdf

Reference17 articles.

1. The Wide Field Imager of the International X-ray Observatory

2. Development of the DEPFET Sensor With Signal Compression: A Large Format X-Ray Imager With Mega-Frame Readout Capability for the European XFEL

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