A novel83mKr tracer method for characterizing xenon gas and cryogenic distillation systems-Reference-Cited by-同舟云学术

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A novel83mKr tracer method for characterizing xenon gas and cryogenic distillation systems

Published:2014-10-17 Issue:10 Volume:9 Page:P10010-P10010
ISSN:1748-0221
Container-title:Journal of Instrumentation
language:
Short-container-title:J. Inst.

Author:

Rosendahl S.,Bokeloh K.,Brown E.,Cristescu I.,Fieguth A.,Huhmann C.,Lebeda O.,Levy C.,Murra M.,Schneider S.,V'enos D.,Weinheimer C.

Publisher

IOP Publishing

Subject

Mathematical Physics,Instrumentation

Link

http://stacks.iop.org/1748-0221/9/i=10/a=P10010/pdf

Reference33 articles.

1. Limit on ν¯emass from observation of the β decay of molecular tritium

2. Energy loss of 18 keV electrons in gaseous T and quench condensed D films

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2. Kr83m calibration of the 2013 LUX dark matter search;Physical Review D;2017-12-26

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4. Removing krypton from xenon by cryogenic distillation to the ppq level;The European Physical Journal C;2017-05

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