Characterization of AgGa0.5In0.5Se2thin films deposited by electron-beam technique
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/42/i=16/a=165413/pdf
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1. Characterization of AgGaSe2 thin films grown by post annealing method
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