Annealing-induced structural changes in tellurium dioxide thin films
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/23/i=9/a=018/pdf
Reference13 articles.
1. The crystal structure of tellurium dioxide. A redetermination by neutron diffraction
2. Paratellurite, a new piezoelectric maternal
3. Elastic and Photoelastic Properties of TeO2Single Crystal
4. Violation of Kleinman's symmetry condition in paratellurite
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1. Selenium-alloyed tellurium oxide for amorphous p-channel transistors;Nature;2024-04-10
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3. An extensive study on the structural evolution and gamma radiation stability of TeO 2 thin films;Materials Science in Semiconductor Processing;2018-02
4. A Study on the properties of tellurium-oxide thin films based on the variable sputtering gas ratio;Journal of the Korean Physical Society;2015-06
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