Studies of tunnel MOS diodes II. Thermal equilibrium considerations
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/4/i=10/a=320/pdf
Reference11 articles.
1. Determination of the Properties of Films on Silicon by the Method of Ellipsometry
2. Studies of tunnel MOS diodes I. Interface effects in silicon Schottky diodes
3. Tunneling in metal-oxide-silicon structures
4. Theory of tunneling into interface states
5. Tunneling from Metal to Semiconductors
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