High-temperature superconductor thin-film characterization by the modulated optical reflectance technique-Reference-Cited by-同舟云学术

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High-temperature superconductor thin-film characterization by the modulated optical reflectance technique

Published:1995-08-01 Issue:8 Volume:8 Page:667-672
ISSN:0953-2048
Container-title:Superconductor Science and Technology
language:
Short-container-title:Supercond. Sci. Technol.

Author:

Almond D P,Barker A K,Bento A C,Singh S K,Appleyard N J,Jackson T J,Palmer S B

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Metals and Alloys,Condensed Matter Physics,Ceramics and Composites

Reference7 articles.

1. Temporal behavior of modulated optical reflectance in silicon

2. Design and performance of an inexpensive substrate heater for off-axis thin film deposition

3. Normal-state transport parameters of epitaxial thin films ofYBa2Cu3O7−δ

4. Theory of the photoacoustic effect with solids

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Comprehensive Environmental Testing of Optical Properties in Thin Films;Procedia CIRP;2014

2. Laser double-heterodyne integrated microscopy of magnetoelectric nanofilms;Vacuum;2013-10

3. Investigation of ferromagnetic properties of LSMO nanolayers by laser modulated reflectance probe;SPIE Proceedings;2010-10-08

4. Modulated optical reflectance method for analysis of magnetoelectric nanomaterials;Journal of Physics: Conference Series;2010-04-01

5. Effect of ageing on optical and thermal properties of YBa2Cu3O7–δ;International Journal of Materials Research;2007-07-01

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