Testing of x-ray microtomography systems using a traceable geometrical standard
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Reference16 articles.
1. Probing systems for dimensional micro- and nano-metrology
2. Tactile and optical microsensors: test procedures and standards
3. Enhancement and Proof of Accuracy of Industrial Computed Tomography (CT) Measurements
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