Influence of force-based crosstalk on the ‘wedge method’ in lateral force microscopy
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Reference19 articles.
1. Method for the calibration of atomic force microscope cantilevers
2. Normal and torsional spring constants of atomic force microscope cantilevers
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4. An improved wedge calibration method for lateral force in atomic force microscopy
5. Lateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimization
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1. The extended wedge method: Atomic force microscope friction calibration for improved tolerance to instrument misalignments, tip offset, and blunt probes;Review of Scientific Instruments;2013-05
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