A desktop supersonic free-jet beam source for a scanning helium microscope (SHeM)
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/23/i=10/a=105901/pdf
Reference25 articles.
1. Focusing Elements and Design Considerations for a Scanning Helium Microscope (SHeM)
2. Imaging with neutral atoms—a new matter-wave microscope
3. Towards Realization of an Atomic de Broglie Microscope: Helium Atom Focusing Using Fresnel Zone Plates
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