On the use of a silicon crystal in a Cauchois-type bent crystal X-ray spectrograph-Reference-Cited by-同舟云学术

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On the use of a silicon crystal in a Cauchois-type bent crystal X-ray spectrograph

Published:1990-11-01 Issue:11 Volume:1 Page:1250-1253
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Deshpande S D,Moghe N V,Sapre V B,Mande C

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Reference13 articles.

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. On the dynamic theory of a focusing Cauchois spectrometer;Technical Physics;2007-06

2. On geometrical aberrations of an X-ray beam experiencing Laue diffraction reflection in a Cauchois scheme;Technical Physics;2007-06

3. A design of an inexpensive demountableX-ray tube;Pramana;1993-11

4. Automation and computerization of microdensitometer;Measurement Science and Technology;1992-05-01

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