Dielectric spectroscopy of a thin surface layer by differential time-domain reflectometry using a coplanar waveguide circuit line probe
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/24/i=2/a=025501/pdf
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1. Dielectric studies of ion fluctuation and chain bending in native DNA
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