Automated pinhole-aperture diagnostic for the current profiling of TWT electron beams
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/24/i=2/a=025901/pdf
Reference18 articles.
1. Review of high-power microwave source research
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3. Use of Scanning Slits for Obtaining the Current Distribution in Electron Beams
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3. Variable beam entrance Faraday cup system for pulsed electron beam current profile characterization;Review of Scientific Instruments;2020-11-01
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