Automatic TFT-LCD mura defect inspection using discrete cosine transform-based background filtering and ‘just noticeable difference’ quantification strategies-Reference-Cited by-同舟云学术

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Automatic TFT-LCD mura defect inspection using discrete cosine transform-based background filtering and ‘just noticeable difference’ quantification strategies

Published:2007-11-30 Issue:1 Volume:19 Page:015507
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Chen Liang-Chia,Kuo Chia-Cheng

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Reference12 articles.

1. Multiscale Detection of Defect in Thin Film Transistor Liquid Crystal Display Panel

2. Rapid defect inspection of display devices with optical spatial filtering

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