Measurement of standard aluminium mirrors, reflectance versus light polarization
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/9/i=2/a=013/pdf
Reference22 articles.
1. The initial oxidation of aluminum thin films at room temperature
2. Ellipsometric and X-ray specular reflection studies on naturally grown overlayers on aluminium thin films
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