Sub-atomic dimensional metrology: developments in the control of x-ray interferometers-Reference-Cited by-同舟云学术

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Sub-atomic dimensional metrology: developments in the control of x-ray interferometers

Published:2012-06-11 Issue:7 Volume:23 Page:074003
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Yacoot Andrew,Kuetgens Ulrich

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Link

http://stacks.iop.org/0957-0233/23/i=7/a=074003/pdf

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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