A new model for electromigration grain boundary noise based on free volume
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Reference26 articles.
1. Recent advances on electromigration in very-large-scale-integration of interconnects
2. Behavior of grain boundary resistivity in metals predicted by a two-dimensional model
3. Influence of high electric direct current densities on grain boundary migration in rolled gold single crystals
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2. New approach for deriving the exact time evolution of the density operator for a diffusive anharmonic oscillator and its Wigner distribution function;Chinese Physics B;2013-03
3. Non-Gaussian analysis of noise for metal interconnection electromigration;Acta Physica Sinica;2012
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