Author:
Tan 谭 Jinhao 金昊,Song 宋 Yushou 玉收,Zhou 周 Jianrong 健荣,Yang 杨 Wenqin 文钦,Jiang 蒋 Xingfen 兴奋,Liu 刘 Jie 杰,Zhang 张 Chaoyue 超月,Zhou 周 Xiaojuan 晓娟,Xia 夏 Yuanguang 远光,Liu 刘 Shulin 术林,Yan 闫 Baojun 保军,Liu 刘 Hui 辉,Wang 王 Songlin 松林,Zhao 赵 Yubin 豫斌,Zhuang 庄 Jian 建,Sun 孙 Zhijia 志嘉,Chen 陈 Yuanbo 元柏
Abstract
Abstract
As a non-destructive testing technology, neutron imaging plays an important role in various fields, including material science, nuclear engineering, and fundamental science. An imaging detector with a neutron-sensitive image intensifier has been developed and demonstrated to achieve good spatial resolution and timing resolution. However, the influence of the working voltage on the performance of the neutron-sensitive imaging intensifier has not been studied. To optimize the performance of the neutron-sensitive image intensifier at different voltages, experiments have been performed at the China Spallation Neutron Source (CSNS) neutron beamline. The change in the light yield and imaging quality with different voltages has been acquired. It is shown that the image quality benefits from the high gain of the microchannel plate (MCP) and the high accelerating electric field between the MCP and the screen. Increasing the accelerating electric field is more effective than increasing the gain of MCPs for the improvement of the imaging quality. Increasing the total gain of the MCP stack can be realized more effectively by improving the gain of the standard MCP than that of the nMCP. These results offer a development direction for image intensifiers in the future.