MSL goniospectrophotometer measurement model

Abstract

Abstract Measurements of both hemispherical reflectance and the bidirectional reflectance distribution function (BRDF) are of interest to a wide range of industries including computer graphics, remote sensing, lighting design, and cosmetics. The scale of directional reflectance is often realised at national metrology institutes using goniospectrophotometers, and by integrating BRDF measurements made over the hemisphere, the scale of hemispherical reflectance can also be realised. This paper describes the measurement model for BRDF and hemispherical reflectance using the MSL goniospectrophotometer, which uses rotation stages to adjust the angle of the sample. The measurement model is applied to measurements of a white Spectralon sample and a white ceramic tile to demonstrate the performance of the instrument. The relative standard uncertainty in the BRDF of a white Spectralon sample at 550 nm is less than 0.1% for in-plane measurements, while the relative standard uncertainty in the hemispherical reflectance of a white Spectralon sample at 560 nm is 0.27%.