Error modelling of quantum Hall array resistance standards-Reference-Cited by-同舟云学术

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Error modelling of quantum Hall array resistance standards

Published:2018-02-05 Issue:2 Volume:55 Page:167-174
ISSN:0026-1394
Container-title:Metrologia
language:
Short-container-title:Metrologia

Author:

Marzano Martina^ORCID,Oe Takehiko^ORCID,Ortolano Massimo^ORCID,Callegaro Luca^ORCID,Kaneko Nobu-Hisa^ORCID

Publisher

IOP Publishing

Subject

General Engineering

Link

http://iopscience.iop.org/article/10.1088/1681-7575/aaa5c1/pdf

Reference43 articles.

1. Resistance metrology based on the quantum Hall effect

2. Cryogenic current comparators and their application to electrical metrology

3. Precision high-value resistance scaling with a two-terminal cryogenic current comparator

4. A first attempt to realize (multiple-QHE devices)-series array resistance standards

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Cascaded Quantum Hall Bisection and Applications to Quantum Metrology;Physical Review Applied;2020-08-20

2. Implementation of a graphene quantum Hall Kelvin bridge-on-a-chip for resistance calibrations;Metrologia;2020-01-23

3. Direct comparison of 1 MΩ quantized Hall array resistance and quantum Hall resistance standard;Metrologia;2018-07-26

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