Abstract
Abstract
This review outlines fundamental principles, instrumentation, and capabilities of angle-resolved photoemission spectroscopy (ARPES) and microscopy. We will present how high-resolution ARPES enables to investigate fine structures of electronic band dispersions, Fermi surfaces, gap structures, and many-body interactions, and how angle-resolved photoemission microscopy (spatially-resolved ARPES) utilizing micro/nano-focused light allows to extract spatially localized electronic information at small dimensions. This work is focused on specific results obtained by the author from strongly correlated copper and ruthenium oxides, to help readers to understand consistently how these techniques can provide essential electronic information of materials, which can, in principle, apply to a wide variety of systems.
Funder
Japan Society for the Promotion of Science
Ministry of Education, Culture, Sports, Science and Technology
Subject
Electrochemistry,Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
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