Material-dependent submicrometer particle trapping in capacitively-coupled plasma sheaths in an intermediate collision regime

Author:

Ono Toshisato,Kortshagen Uwe RORCID,Hogan Christopher JORCID

Abstract

Abstract Understanding submicrometer particle behavior in non-thermal capacitively coupled plasmas (CCPs) is important in the application of CCP reactors in thin-film vapor deposition; nucleated and resuspended particles can deposit on thin films, forming defects. Prior studies of supermicrometer particle behavior in CCP reactors have revealed that particles are trapped in the pre-sheath or sheath regions near electrodes, but have examined in detail neither the trapping of submicrometer particles, nor the influence of particle material properties on trapping. Using laser light scattering (LLS), we examined trapping of submicrometer metal oxide particles (radii in the 211 nm–565?nm range) of 6 distinct material compositions in the pre-sheath/sheath region of a CCP reactor operated at pressures in the 0.5–2.0 Torr range. We specifically focus on trapping near the upper electrode of a horizontally-oriented reactor. In this instance, trapping is brought about by a balance between electrostatic forces and gravitational forces driving particles away from the electrode, with ion drag forces driving particles toward the electrode. LLS measurements reveal that submicrometer particles are trapped near the upper electrode for all particle sizes, types, and operating pressures, with the trapping location at an increased distance away from the electrode with decreased CCP reactor pressure. Interestingly, we find the trapping location shifts slightly farther from the top electrode with increasing material dielectric constant. This suggests that the ion drag force is influenced by particle material properties, though in an unclarified manner. Measured trapping locations are also compared to model predictions where particle charge levels and the ion drag force are calculated using expressions based on ion trajectory calculations in a plasma sheath accounting for ion–neutral collisions. Predicted ion densities required for trapping are a factor of 6–16 higher than calculated at the observed particle trapping locations when applying a dissipative ion–particle encounter model, with more substantial disagreement found when considering a non-dissipative encounter model. In total, our results confirm that submicrometer particle trapping occurs at the upper electrode of CCP reactors, which must be facilitated by a balance largely between electrostatic and gravitational forces opposed by ion drag forces, but suggest future studies will be required to understand how particle material properties affect forces on particles on the plasma volume boundary, and how the ion drag force is sufficiently high to facilitate trapping.

Funder

CCP

Army Research Office

Publisher

IOP Publishing

Subject

Condensed Matter Physics

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3