Study of metal-semiconductor interface states using Schottky capacitance spectroscopy
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,Condensed Matter Physics
Link
http://stacks.iop.org/0022-3719/16/i=12/a=026/pdf
Reference18 articles.
1. Determination of the density and the relaxation time of silicon-metal interfacial states
2. Interfacial states spectrum of a metal-silicon junction
3. Study of PtGaAs interface states
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