Comparative analysis on resistance profiling along tapered semiconductor nanowires: multi-tip technique versus transmission line method
Author:
Funder
Bundesministerium für Bildung und Forschung
Carl-Zeiss-Stiftung
Deutsche Forschungsgemeinschaft
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://iopscience.iop.org/article/10.1088/1361-648X/aa801e/pdf
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