Application of Bayesian model averaging to the determination of thermal expansion of single-crystal silicon
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://iopscience.iop.org/article/10.1088/1361-6501/ab094b/pdf
Reference19 articles.
1. Linear thermal expansion measurements on silicon from 6 to 340 K
2. Bayesian model averaging: a tutorial (with comments by M. Clyde, David Draper and E. I. George, and a rejoinder by the authors
3. Thermal expansion coefficient of single-crystal silicon from 7 K to 293 K
4. Accurate extraction of thermal expansion coefficients and their uncertainties from high precision interferometric length measurements
5. Thermal expansion of some group IV elements and ZnS
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