A derivation of the electrical capacitance tomography sensitivity matrix

Abstract

Abstract The sensitivity matrix, used in electrical capacitance tomography to connect capacitance readings to a dielectric distribution, is derived without assumptions on the magnitude of the relative permittivity and without dropping higher order terms. Deriving this matrix may provide a means to improve the performance of the various published electrical capacitance tomography algorithms and extend their applicability to a wider range of dielectric materials.