Analysis of uncertainties in the measurement of the space charge distribution in dielectrics

Abstract

Abstract The results obtained from the commonly used space charge distribution measurement methods are frequently apparent and one-dimensional results of a localized area; moreover, random errors can be caused by various factors. In this work, three factors—sample thickness uniformity, pressure wave intensity uniformity, and space charge distribution uniformity—that may cause measurement uncertainties are examined. The analysis and evaluation of the experimental data are affected by the measurement uncertainties, which are particularly noticeable in experiments on semiconductive electrode-flat polyethylene samples that use the laser-induced pressure propagation method. These factors are investigated separately using several auxiliary experiments, including laser beam spot energy distribution measurements and space charge distribution measurements, at different measurement positions on the same uniform sample. A clear and intelligible model is developed to discuss the influence of these factors on the uncertainties in the space charge distribution measurement in dielectrics.