Transmission-mode perpendicular incidence ellipsometry of anisotropic thin films-Reference-Cited by-同舟云学术

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Transmission-mode perpendicular incidence ellipsometry of anisotropic thin films

Published:1994-03 Issue:2 Volume:25 Page:43-49
ISSN:0150-536X
Container-title:Journal of Optics
language:
Short-container-title:J. Opt.

Author:

Wu Qi Hong,Hodgkinson I

Publisher

IOP Publishing

Reference9 articles.

1. Optical anisotropy in thin films deposited obliquely: in situ observations and computer modeling

2. Measurement of the principal refractive indices of thin films deposited at oblique incidence

3. Anisotropy in thin films: modeling and measurement of guided and nonguided optical properties: application to TiO_2 films

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