Multimodal hard x-ray imaging with resolution approaching 10 nm for studies in material science-Reference-Cited by-同舟云学术

Multimodal hard x-ray imaging with resolution approaching 10 nm for studies in material science

Published:2018-03-19 Issue:1 Volume:2 Page:011001
ISSN:2399-1984
Container-title:Nano Futures
language:
Short-container-title:Nano Futures

Author:

Yan Hanfei^ORCID,Bouet Nathalie,Zhou Juan,Huang Xiaojing^ORCID,Nazaretski Evgeny,Xu Weihe,Cocco Alex P,Chiu Wilson K S,Brinkman Kyle S^ORCID,Chu Yong S

Funder

Office of Science, US Department of Energy

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,General Materials Science,Biomedical Engineering,Atomic and Molecular Physics, and Optics,General Chemistry,Bioengineering

Link

http://iopscience.iop.org/article/10.1088/2399-1984/aab25d/pdf

Reference41 articles.

1. Quantitative Nanoscale Imaging of Lattice Distortions in Epitaxial Semiconductor Heterostructures Using Nanofocused X-ray Bragg Projection Ptychography

2. High-Resolution Scanning X-ray Diffraction Microscopy

3. The Race to X-ray Microbeam and Nanobeam Science

4. Nanoscale X-ray imaging

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