Length control and sharpening of atomic force microscope carbon nanotube tips assisted by an electron beam-Reference-Cited by-同舟云学术

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Length control and sharpening of atomic force microscope carbon nanotube tips assisted by an electron beam

Published:2005-09-13 Issue:11 Volume:16 Page:2493-2496
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Martinez J,Yuzvinsky T D,Fennimore A M,Zettl A,García R,Bustamante C

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/16/i=11/a=004/pdf

Reference26 articles.

1. Helical microtubules of graphitic carbon

2. Room-temperature transistor based on a single carbon nanotube

3. High brightness electron beam from a multi-walled carbon nanotube

4. Glucose Biosensors Based on Carbon Nanotube Nanoelectrode Ensembles

5. Rotational actuators based on carbon nanotubes

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3. Advancement in fabrication of carbon nanotube tip for atomic force microscope using multi-axis nanomanipulator in scanning electron microscope;Nanotechnology;2022-02-01

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5. In Situ Reproducible Sharp Tips for Atomic Force Microscopy;Physical Review Applied;2021-03-26

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