In situfabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope-Reference-Cited by-同舟云学术

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In situfabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope

Published:2015-03-23 Issue:15 Volume:26 Page:154001
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Zhang Chao,Xu Zhi,Tian Wei,Tang Dai-Ming,Wang Xi,Bando Yoshio,Fukata Naoki,Golberg Dmitri

Funder

Ministry of Education, Culture, Sports, Science, and Technology

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/26/i=15/a=154001/pdf

Reference36 articles.

1. Programmable Resistive-Switch Nanowire Transistor Logic Circuits

2. Design of Nanowire Optical Cavities as Efficient Photon Absorbers

3. Looking into Meta-Atoms of Plasmonic Nanowire Metamaterial

4. Ultrafast acousto-plasmonic control and sensing in complex nanostructures

5. High Performance Silicon Nanowire Field Effect Transistors

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