Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy-Reference-Cited by-同舟云学术

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Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy

Published:2016-09-15 Issue:42 Volume:27 Page:425707
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Balke Nina,Jesse Stephen,Yu Pu,Ben Carmichael ,Kalinin Sergei V,Tselev Alexander

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/27/i=42/a=425707/pdf

Reference57 articles.

1. Nanoscale Visualization and Control of Ferroelectric Domains by Atomic Force Microscopy

2. Nonlinear Phenomena in Multiferroic Nanocapacitors: Joule Heating and Electromechanical Effects

3. Nanoscale Imaging of Plasmonic Hot Spots and Dark Modes with the Photothermal-Induced Resonance Technique

4. Real Space Mapping of Li-Ion Transport in Amorphous Si Anodes with Nanometer Resolution

5. Imaging and measurement of local mechanical material properties by atomic force acoustic microscopy

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