Is keV ion-induced pattern formation on Si(001) caused by metal impurities?-Reference-Cited by-同舟云学术

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Is keV ion-induced pattern formation on Si(001) caused by metal impurities?

Published:2010-01-25 Issue:8 Volume:21 Page:085301
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Macko Sven,Frost Frank,Ziberi Bashkim,Förster Daniel F,Michely Thomas

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/21/i=8/a=085301/pdf

Reference55 articles.

1. The Optical Properties of 'Moth Eye' Antireflection Surfaces

2. Evolution of surface topography of fused silica by ion beam sputtering

3. nm- and μm-Scale Surface Roughness on Glass with Specific Optical Scattering Characteristics on Demand

4. Atomic-beam alignment of inorganic materials for liquid-crystal displays

5. Ion induced nanoscale surface ripples on ferromagnetic films with correlated magnetic texture

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