Double-Crystal x-Ray Diffraction Study on Ta/Al Multilayers-Reference-Cited by-同舟云学术

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Double-Crystal x-Ray Diffraction Study on Ta/Al Multilayers

Published:1992-11 Issue:11 Volume:9 Page:605-608
ISSN:0256-307X
Container-title:Chinese Physics Letters
language:
Short-container-title:Chinese Phys. Lett.

Author:

Lisong Xiu,Xiangyang Yuan,Ziqin Wu,Shusheng Jiang,An Hu,Jiyong Zhao,Jianhua Jiang

Publisher

IOP Publishing

Subject

General Physics and Astronomy

Link

https://iopscience.iop.org/article/10.1088/0256-307X/9/11/011/pdf

Reference10 articles.

1. X‐ray rocking curve analysis of superlattices

2. Interference effects in x‐ray double‐crystal rocking curves of Ga1−xAlxAs/GaAs laser structures and superlattices

3. Determination of roughness correlations in multilayer films for x‐ray mirrors

4. Simulation of x‐ray diffraction intensity variation of W/Si multilayer after annealing

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