Comparison between constant and step‐stress tests for Weibull models
Author:
Affiliation:
1. Kansas State University, Manhattan, Kansas, USA
Publisher
Emerald
Subject
Strategy and Management,General Business, Management and Accounting
Reference6 articles.
1. 1.Nelson, W. Accelerated Testing: Statistical Models, Test Plans, and Data Analyses”, 1990; John Wiley and Sons, New York, NY, 1990.
2. 2.Kielpinski, T.J. and Nelson, W. “Optimum censored accelerated life tests for normal and lognormal life distribution”, IEEE Trans. Reliability, Vol. R‐24, December 1975, pp. 310‐20.
3. 3.Nelson, W. “Accelerated life testing‐step‐stress models and data analyses”, IEEE Trans. Reliability, Vol. R‐29, June 1980, pp. 103‐8.
4. Optimum simple step-stress accelerated life tests with censoring
5. 5.Miller, R. and Nelson, W. “Optimum simple step‐stress plans for accelerated life testing”, IEEE Trans. Reliability, Vol. R‐32, April 1983, pp. 59‐65.
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