Optimizing the reflow profile via defect mechanism analysis

Author:

Lee Ning‐Cheng

Abstract

A reflow profile is proposed which is engineered to optimize soldering performance based on defect mechanism analysis. In general, a slow ramp‐up rate is desired in order to minimize hot slump, bridging, tombstoning, skewing, wicking, opens, solder beading, solder balling, and components cracking. A minimized soaking zone reduces voiding, poor wetting, solder balling, and opens. Use of a low peak temperature lessens charring, delamination, intermetallics, leaching, dewetting, and voiding. A rapid cooling rate helps to reduce grain size as well as intermetallic growth, charring, leaching and dewetting. However, a slow cooling rate reduces solder or pad detachment. The optimized profile favors that the temperature ramps up slowly until reaching about 180°C. Implementation of the optimized profile requires the support of a heating‐efficient reflow technology with a controllable heating rate. Emergence of the forced air convection reflow provides a controllable heating rate. In addition, it is not sensitive to variation in parts’ features, thus allows the realization of the optimized profile.

Publisher

Emerald

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science,Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science

Reference7 articles.

1. Hance, W. and Lee, N.‐C. (1991), “Solder beading in SMT ‐ cause and cure”, Proc. of SMI, San Jose, CA.

2. Hance, W. and Lee, N.‐C. (1995), “Voiding mechanism in BGA assembly”, Proc. of ISHM.

3. Jaeger, P. and Lee, N.‐C. (1992), “A model study of low residue no‐clean solder paste”, Proc. of Nepcon West, Anaheim, CA.

4. Lee, N.‐C. (1994), “How to make solder paste work in ultra‐fine‐pitch and non‐CFC era”, Short Course of Nepcon West, Anaheim, CA.

5. Lee, N.‐C. (1997), “Reflow soldering: meeting the SMT challenge”, in Proc. of Nepcon West, Anaheim, CA.

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