Modified chain sampling plan for assuring percentile life under Weibull distribution and generalized exponential distribution

Abstract

Purpose The purpose of this paper is to design a modified chain sampling plan for assuring the product percentile life where the lifetime follows Weibull or generalized exponential distributions (GEDs). In order to reduce the cost of inspection when implementing the proposed modified chain sampling plan, it is also considered the economic aspect of designing of proposed plan in this paper. Design/methodology/approach The authors have designed the proposed plan on the basis of two points on the operating characteristic (OC) curve approach. The optimization problem is used to determine the plan parameters of the proposed plan so that the specified values of producer’s risk and consumer’s risk are satisfied simultaneously. Findings The results we have obtained, confirm that the proposed plan will be very effective in reducing the sample size rather than other existing sampling plans. The OC curves of proposed plan, chain sampling plan and zero acceptance number single sampling plan show that the performance of proposed plan in discriminating the good and poor quality lots is better than other two plans. In this paper, it is proved that the value of number of preceding lots required for current lot disposition plays an important role. Originality/value The proposed modified chain sampling plan for assuring the percentile lifetime of the products under Weibull or GEDs is not available in the literature. The proposed plan can be used in all the manufacturing industries to assure the product percentile lifetime with minimum sample size as well as minimum cost.