Author:
Yu-qi ZHANG, ,Qiang KAN,Jia ZHAO, , ,
Publisher
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences
Cited by
1 articles.
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1. Reliability investigation and failure analysis of 25Gb/s 850 nm oxide-confined VCSELs;Fourteenth International Conference on Information Optics and Photonics (CIOP 2023);2023-11-24