Author:
Zaluzec N. J.,Fraser H. L.
Abstract
Several techniques have been developed for quantitative x-ray microanalysis of thin metal foils. These techniques usually provide relative elemental concentrations, and assume that for a “thin” homogeneous alloy of elements A and B, the ratio of intensity (I) of any two characteristic x-ray peaks (e.g.IAKα/IBKα) should be independent of specimen thickness. Recently, Fraser et al., conducted experiments using a highly ordered alloy (β-NiAl) to investigate this assumption, and indeed showed that in electron transparent regions of the foils there was a marked variation in the ratio of the Ka peaks of Ni and Al, respectively. The results given by Fraser et al., are summarized in Fig. 1.
Publisher
Cambridge University Press (CUP)
Reference5 articles.
1. Cliff, G. and Lorimer, G. W. : Pro. 5th Europ. Conf. on E.M. (1972), 136.
2. Philibert, J. and Tixier, R. : NBS special pub #298 Quantitative Electron Probe Microanalyses, p. 13.
3. Jacobs, M. H. and Babororoska, J.: Ibid, 140.
4. Fraser, H. L. , Zaluzec, N. J. , Woodhouse, J. B. , and Sis, L. B. : 33rd Ann. Proc. of EMSA (1975), 106.
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