Theoretical analysis of double-crystal spectrograph for high-resolution spectroscopy of laser-generated X-rays

Abstract

Vertical dispersion variant of the double-crystal spectrograph is analyzed and its basic quantitative characteristics (luminosity, resolving power) are computed using ray tracing code. It is shown that geometric apparatus smearing is minimized due to high dispersion and spectral resolution may considerably exceed the single-crystal diffraction limit. Performing high-resolution spectral work, the efficiency of the double-crystal apparatus exceeds that of the flat single-crystal spectrograph. The usefulness of this method in laser plasma spectroscopy is demonstrated analyzing the detection of phosphorus He-like resonance line and its satellites.