Author:
Rhead S. D.,Howes P. B.,Roy M.,Rawle J. L.,Nicklin C.,Norris C.
Abstract
We present an X-ray diffraction study of a semiconductor symmetric tilt grain boundary. The theory of crystal truncation rod scattering is extended to bicrystal interfaces and compared with experimental data measured at the Diamond Light Source.
Publisher
Cambridge University Press (CUP)