Author:
Kondo Y.,Harada Y.,Kersker M.
Abstract
The pattern of the higher order Laue-zone (HOLZ) lines is one of the useful information which is usually appeared in convergent beam electron diffraction (CBED) pattern. However, it is difficult to see details of HOLZ pattern in CBED, because the diffraction disk is of high intensity and complex patterns caused by the interaction of the zeroth order Laue-zene reflection. Recently, to avoid this disadvantage, we report a technique to observed HOLZ pattern selectively using a hollow-cone illumination. In this report, the incident convergent angle dependency of the pattern by hollow-cone illumination will be described.Hollow-cone illumination was achieved by the electronic hollow-cone illumination (EHCI) device (the ray path of EHCI is shown in Fig. 1). A JEM-1200EX With EHCI device was used in this experiment.
Publisher
Cambridge University Press (CUP)