SESAM: Exploring the Frontiers of Electron Microscopy-Reference-Cited by-同舟云学术

SESAM: Exploring the Frontiers of Electron Microscopy

Published:2006-10-11 Issue:6 Volume:12 Page:506-514
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Koch Christoph T.,Sigle Wilfried,Höschen Rainer,Rühle Manfred,Essers Erik,Benner Gerd,Matijevic Marko

Abstract

We report on the sub-electron-volt-sub-angstrom microscope (SESAM), a high-resolution 200-kV FEG-TEM equipped with a monochromator and an in-column MANDOLINE filter. We report on recent results obtained with this instrument, demonstrating its performance (e.g., 87-meV energy resolution at 10-s exposure time, or a transmissivity of the energy filter of T1 eV = 11,000 nm2). New opportunities to do unique experiments that may advance the frontiers of microscopy in areas such as energy-filtered TEM, spectroscopy, energy-filtered electron diffraction and spectroscopic profiling are also discussed.

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

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