Advances in Large-area Sample Preparation Using Broad Argon Ion Beam Milling for Multiphase Materials
Author:
Publisher
Cambridge University Press (CUP)
Subject
Instrumentation
Reference7 articles.
1. EBSD and TEM Microstructural Studies of New Fuel Cladding in Generation IV Sodium-cooled Fast Nuclear Reactors
2. SEM and TEM characterization of plastic deformation structures in Aluminum by EBSD, TKD, and PED-based orientation imaging techniques
3. Sample Preparation Using Broad Argon Ion Beam Milling for Electron Backscatter Diffraction (EBSD) Analysis
4. Combining Emerging Sample Preparation Methods, SEM, and TEM Investigations for Microelectronics Device Characterization at Multiple Scales
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